Our new LIV100 is a measurement system for the characterization of laser diodes, whether packaged or in bare chip form. This instrument performs a complete LIV measurement in short time at high currents.

Properties 

The LIV100 employs a digitally programmable analogue end stage for flexible and accurate current control. Currents of up to 200A with pulse durations of 150ns to 240µs are generated with rise and fall times of 25ns – essentially without overshoot.The system is controlled via a USB port for automated measurements. A parameter set is uploaded from the control computer. Following the start command, the LIV100 then performs the complete measurement sequence fully autonomously.

Fields of Application

Applications include laser diode characterization before packaging, inspection of incoming goods and for OEMs.

The LIV100 from Artifex Engineering generates current pulses up to 200A with rise and fall times of 25ns. This unique feature allows accurate testing of high power diode lasers at the chip or bar level without undue thermal loading of the device under test.

The fast data acquisition provides for high throughput.