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On-line industrial metrology. Surface control, quality control. 
Artifex Engineering has released a new MIR spectrometer for industrial metrology. Properties This instrument utilizes a fast detector array to deliver a complete spectrum from 1.4 – 13.5μm with a resolution of 0.7 μm at a rate of one measurement per second. The design is robust and uses no wearable mechanical parts thus making this instrument predestined for industrial environments such as online quality control. Typical applications are the analysis of coatings for the solar panel industry or heat reducing window panes. This novel spectrometer – as with all of Artifex Engineering’s products – can be customized to fit a particular application. Fields of Application Quality assurance production control thin film technology surface technology
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